The structure analysis of MoOx/TiO2(110) by polarization-dependent total-reflection fluorescence X-ray absorption fine structure

被引:9
|
作者
Chun, WJ
Asakura, K
Iwasawa, Y [1 ]
机构
[1] Univ Tokyo, Grad Sch Sci, Dept Chem, Bunkyo Ku, Tokyo 1130033, Japan
[2] Univ Tokyo, Fac Sci, Res Ctr Spectrochem, Bunkyo Ku, Tokyo 1130033, Japan
关键词
polarization-dependent total-reflection fluorescence XAFS; TiO2 (110); Mo dimer; model catalyst;
D O I
10.1016/S0920-5861(98)00204-1
中图分类号
O69 [应用化学];
学科分类号
081704 ;
摘要
The surface structure analysis of a model catalyst MoOx/TiO2(110) was for the first time performed by polarization-dependent total-reflection fluorescence X-ray absorption fine structure (PTRF-XAFS) in three different directions of the crystal surface. Two samples of MoOx/TiO2(110) were prepared by an impregnation of (NH4)(6)Mo7O24. 4H(2)O using ultra high purity water and normal distilled water. The PTRF-XAFS analysis revealed that anisotropic Mo dimer species was preferentially formed on the TiO2(110) surface, with Mo-Mo bond (0.335 nm) parallel to the [1 (1) over bar 0] direction when the ultra high purity water was used as the solvent. On the other hand, the Mo oxide on the surface prepared using normal distilled water had a symmetric tetrahedral structure (MoO4) with Mo-O of 0.176 nm, which was due to the coexistence of alkaline metals at the surface. (C) 1998 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:309 / 314
页数:6
相关论文
共 50 条
  • [1] Three-dimensional structure analyses of Cu species dispersed on TiO2(110) surfaces studied by polarization-dependent total-reflection fluorescence X-ray absorption fine structure (PTRF-XAFS)
    Tanizawa, Y
    Shido, T
    Chun, WJ
    Asakura, K
    Nomura, M
    Iwasawa, Y
    JOURNAL OF PHYSICAL CHEMISTRY B, 2003, 107 (47): : 12917 - 12929
  • [2] Polarization-Dependent Total-Reflection Fluorescence X-ray Absorption Fine Structure for 3D Structural Determination and Surface Fine Tuning
    Satoru Takakusagi
    Wang-Jae Chun
    Hiromitsu Uehara
    Kiyotaka Asakura
    Yasuhiro Iwasawa
    Topics in Catalysis, 2013, 56 : 1477 - 1487
  • [3] Polarization-Dependent Total-Reflection Fluorescence X-ray Absorption Fine Structure for 3D Structural Determination and Surface Fine Tuning
    Takakusagi, Satoru
    Chun, Wang-Jae
    Uehara, Hiromitsu
    Asakura, Kiyotaka
    Iwasawa, Yasuhiro
    TOPICS IN CATALYSIS, 2013, 56 (15-17) : 1477 - 1487
  • [4] Three-dimensional analysis of the local structure of Cu on TiO2(110) by in situ polarization-dependent total-reflection fluorescence XAFS
    Tanizawa, Y
    Chun, WJ
    Shido, T
    Asakura, K
    Iwasawa, Y
    JOURNAL OF SYNCHROTRON RADIATION, 2001, 8 (02) : 508 - 510
  • [5] Anisotropic structure analysis for Mo oxides on TiO2(110) single crystal surface by polarization-dependent total-reflection fluorescence EXAFS
    Chun, WJ
    Asakura, K
    Iwasawa, Y
    CHEMICAL PHYSICS LETTERS, 1998, 288 (5-6) : 868 - 872
  • [6] Portable ultrahigh-vacuum sample storage system for polarization-dependent total-reflection fluorescence x-ray absorption fine structure spectroscopy
    Watanabe, Yoshihide
    Nishimura, Yusaku F.
    Suzuki, Ryo
    Uehara, Hiromitsu
    Nimura, Tomoyuki
    Beniya, Atsushi
    Isomura, Noritake
    Asakura, Kiyotaka
    Takakusagi, Satoru
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 2016, 34 (02):
  • [7] Nanoarchitecture of semiconductor titania nanosheets revealed by polarization-dependent total reflection fluorescence X-ray absorption fine structure
    Fukuda, K
    Nakai, I
    Oishi, C
    Nomura, M
    Harada, M
    Ebina, Y
    Sasaki, T
    JOURNAL OF PHYSICAL CHEMISTRY B, 2004, 108 (35): : 13088 - 13092
  • [8] Total-reflection X-ray absorption fine structure on liquid surface
    Tanida, H
    SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY, 2004, 59 (08) : 1071 - 1076
  • [9] Three-dimensional structure analysis of Mo oxides on TiO2(110) by polarization-dependent total reflection fluorescence XAFS
    Chun, WJ
    Asakura, K
    Iwasawa, Y
    JOURNAL DE PHYSIQUE IV, 1997, 7 (C2): : 921 - 922
  • [10] Development of a chamber for in situ polarized total-reflection fluorescence x-ray absorption fine structure spectroscopy
    Shirai, M
    Nomura, M
    Asakura, K
    Iwasawa, Y
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1995, 66 (12): : 5493 - 5498