Testing for convexity with Fourier descriptors

被引：11
|
作者：
Kakarala, R [1 ]
机构：
[1] Univ Auckland, Dept Elect & Elect Engn, Auckland 1, New Zealand
来源：
ELECTRONICS LETTERS | 1998年 / 34卷 / 14期
关键词：
D O I：
10.1049/el:19980943
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Fourier descriptors are widely used for determining the properties of planar contours. A test for determining whether a set of Fourier descriptors describes a convex contour is presented.
引用
收藏
页码：1392 / 1393
页数：2
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