Symmetry-Aware Mesh Segmentation into Uniform Overlapping Patches

被引:6
|
作者
Dessein, A. [1 ]
Smith, W. A. P. [2 ]
Wilson, R. C. [2 ]
Hancock, E. R. [2 ]
机构
[1] Univ Bordeaux, IMB LaBRI, Bordeaux, France
[2] Univ York, Dept Comp Sci, York, N Yorkshire, England
关键词
mesh segmentation; uniform overlapping patches; symmetry-aware processing; furthest-point sampling; texture stitching; texture synthesis; TRANSFORM;
D O I
10.1111/cgf.12997
中图分类号
TP31 [计算机软件];
学科分类号
081202 ; 0835 ;
摘要
We present intrinsic methods to address the fundamental problem of segmenting a mesh into a specified number of patches with a uniform size and a controllable overlap. Although never addressed in the literature, such a segmentation is useful for a wide range of processing operations where patches represent local regions and overlaps regularize solutions in neighbour patches. Further, we propose a symmetry-aware distance measure and symmetric modification to furthest-point sampling, so that our methods can operate on semantically symmetric meshes. We introduce quantitative measures of patch size uniformity and symmetry, and show that our segmentation outperforms state-of-the-art alternatives in experiments on a well-known dataset. We also use our segmentation in illustrative applications to texture stitching and synthesis where we improve results over state-of-the-art approaches.
引用
收藏
页码:95 / 107
页数:13
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