NbN films on vicinal to the X-cut of LiNbO3 surfaces

被引：5

作者：

Ionov, A. M. ^{[1
,4
]}

Chichkov, V., I ^{[2
]}

Shamrai, A., V ^{[3
]}

Ili'chev, I., V ^{[3
]}

Ksenz, A. S. ^{[1
]}

Orlov, V., I ^{[1
]}

Egorov, S., V ^{[1
]}

Orlova, N. N. ^{[1
]}

Shvets, I., V ^{[5
]}

Bozhko, S., I ^{[1
]}

机构：

[1] ISSP RAS, Chernogolovka, Russia

[2] NUST MISIS, Moscow, Russia

[3] Ioffe Inst, St Petersburg, Russia

[4] Natl Res Univ Higher Sch Econ HSE Univ, Moscow, Russia

[5] Trinity Coll Dublin, Sch Phys, Dublin, Ireland

来源：

MATERIALS LETTERS | 2020年 / 260卷

关键词：

Grain boundaries; Nanocrystalline materials; NbN film;

D O I：

10.1016/j.matlet.2019.126918

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

We report a study of epitaxial superconductive NbN films on vicinal to the X-cut of single crystal LiNbO3 substrates grown using reactive magnetron sputtering of Nb target in Ar-N-2 atmosphere. It is found that the NbN films reveal sharp superconductive transition at T-C = 15.2 K and anisotropy of critical current. Critical current measured along the Z direction exceeds J(C) along the Y direction regardless of the orientation of step edges of the vicinal surfaces. The anisotropy effect is attributed to NbN film uniaxial stress due to the lattice mismatch of NbN (0 01) layer along the Z direction of LiNbO3. (C) 2019 Published by Elsevier B.V.

引用

页数：4

共 50 条

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