Engineering the Complex-Valued Constitutive Parameters of Metamaterials for Perfect Absorption

被引：7

作者：

Wang, Pengwei ^{[1
]}

Chen, Naibo ^{[1
]}

Tang, Chaojun ^{[1
]}

Chen, Jing ^{[2
,3
]}

Liu, Fanxin ^{[1
,3
]}

Sheng, Saiqian ^{[1
]}

Yan, Bo ^{[1
]}

Sui, Chenghua ^{[1
]}

机构：

[1] Zhejiang Univ Technol, Dept Appl Phys, Ctr Opt & Optoelect Res, Hangzhou 310023, Zhejiang, Peoples R China

[2] Nanjing Univ Posts & Telecommun, Coll Elect Sci & Engn, Nanjing 210023, Jiangsu, Peoples R China

[3] Nanjing Univ, Natl Lab Solid State Microstruct, Nanjing 210093, Jiangsu, Peoples R China

来源：

NANOSCALE RESEARCH LETTERS | 2017年 / 12卷

基金：

高等学校博士学科点专项科研基金; 中国国家自然科学基金;

关键词：

Metamaterials; Perfect absorbers; Anti-reflection coating; Light harvesting; OPTICAL METAMATERIALS; PLASMONIC SENSOR; LIGHT-ABSORPTION; SOLAR-CELLS; ABSORBER; BAND; MULTIBAND; DESIGN; BROAD; INTERFERENCE;

D O I：

10.1186/s11671-017-2048-2

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

We theoretically studied how to directly engineer the constitutive parameters of metamaterials for perfect absorbers of electromagnetic waves. As an example, we numerically investigated the necessary refractive index n and extinction coefficient k and the relative permittivity epsilon and permeability mu of a metamaterial anti-reflection layer, which could cancel the reflection from a hydrogenated amorphous silicon (alpha-Si:H) thin film on a metal substrate, within the visible wavelength range from 300 to 800 nm. We found that the metamaterial anti-reflection layer should have a negative refractive index (n < 0) for short-wavelength visible light but have a positive refractive index (n > 0) for long-wavelength visible light. The relative permittivity epsilon and permeability mu could be fitted by the Lorentz model, which exhibited electric and magnetic resonances, respectively.

引用

页数：6

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