Production test methods for measuring 'out-of-band' interference of ultra wide band (UWB) devices

被引:1
|
作者
Bhattacharya, S [1 ]
Chatterjee, A [1 ]
机构
[1] Georgia Inst Technol, Sch ECE, Atlanta, GA 30332 USA
关键词
D O I
10.1109/VTS.2005.67
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
The recent increase in demand within the wireless user community for short-range, very high rate data transmission (data, video) devices has spurred the growth of a new generation of 4G devices, viz. ultra-wideband (UWB). Due to its wide band of operation (3.1-10.6GHz) and non-conventional transmit/receive scheme (using short-duration, narrow baseband pulses), spectral power leakage to outside frequency bands causes interference with other wireless standards. In this paper, we focus on 'out-of-band' interference testing of UWB devices during production test. Due to stringent FCC spectrum regulations and very low power spectral density levels of the associated signals (-41.3dBm/MHz), production testing for interference is a big challenge and can incur significant test time, resulting in increased test cost. We propose a simple, low-cost test methodology for testing UWB devices. Simulation results are presented for a typical home environment. The channel model used can be easily modified and incorporated in any production test environment. Results show that using simple tests, estimates of 'out-of-band' interference can be obtained easily using the proposed test methodology.
引用
收藏
页码:137 / 142
页数:6
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