Enhanced Optical Performance of AlGaN-Based Deep Ultraviolet Light-Emitting Diodes by Electrode Patterns Design

被引:22
|
作者
Chen, Qian [1 ]
Dai, Jiangnan [1 ]
Li, Xiaohang [2 ]
Gao, Yang [1 ]
Long, Hanling [1 ]
Zhang, Zi-Hui [3 ]
Chen, Changqing [1 ]
Kuo, Hao-Chung [4 ,5 ]
机构
[1] Huazhong Univ Sci & Technol, Wuhan Natl Lab Optoelect, Wuhan 430074, Peoples R China
[2] King Abdullah Univ Sci & Technol, Adv Semicond Lab, Thuwal 23955, Saudi Arabia
[3] State Key Lab Reliabil & Intelligence Elect Equip, Tianjin 300401, Peoples R China
[4] Natl Chiao Tung Univ, Dept Photon, Hsinchu 30010, Taiwan
[5] Natl Chiao Tung Univ, Inst Electroopt Engn, Hsinchu 30010, Taiwan
基金
中国国家自然科学基金;
关键词
DUV LEDs; PN electrode location; current spreading; EFFICIENCY; TEMPERATURE; LEDS;
D O I
10.1109/LED.2019.2948952
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Low external quantum efficiency of deep ultraviolet light-emitting diodes (DUV LEDs) and current crowding can result in considerable heat generation, which has a great negative impact on device performance. In this paper, we investigate the influence of different electrode patterns on the photoelectric and thermal performance of DUV LEDs. We find that different electrode designs can achieve drastically different optical powers, with the superior design being the n-type electrode surrounding the active region. Moreover, compared with the counterpart, the superior design does not affect the electrical performance. The main reason is that the N-surrounding electrode pattern can provide enough current paths for carrier transport, thus realizing a more uniform current injection and can further improve the external quantum efficiency for DUV LEDs.
引用
收藏
页码:1925 / 1928
页数:4
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