Plasmonic Structured Illumination Microscopy

被引：157

作者：

Wei, Feifei ^{[1
]}

Liu, Zhaowei ^{[1
]}

机构：

[1] Univ Calif San Diego, Dept Elect & Comp Engn, La Jolla, CA 92093 USA

来源：

NANO LETTERS | 2010年 / 10卷 / 07期

基金：

美国国家科学基金会;

关键词：

Super resolution imaging; surface plasmons; structured illumination microscopy; FAR-FIELD SUPERLENS; DIFFRACTION-LIMIT; INTERFERENCE NANOLITHOGRAPHY; FLUORESCENCE MICROSCOPY; EXCITATION MICROSCOPY; OPTICAL RESOLUTION; SILVER ELECTRODE; SPECTROSCOPY; IMPROVEMENT; HYPERLENS;

D O I：

10.1021/nl1011068

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

We propose a super resolution imaging technique called plasmonic structured illumination microscopy (PSIM), which combines the structured illumination microscopy technique with the tunable surface plasmon interference Because of the high-resolution enabled by using surface plasmon interference as an illumination source, PSIM possesses higher image resolving power compared with conventional structured illumination microscopy To demonstrate the technique, we present two specific types of plasmonic structure designs for PSIM The final images from the simulations show 3-fold and 4-fold resolution improvement compared with conventional epi-fluorescence microscopy

引用

页码：2531 / 2536

页数：6

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