Similarities in the growth mechanism for the synthesis of silicon carbide, silicon nitride, and silicon

被引:0
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作者
Grow, JM [1 ]
机构
[1] New Jersey Inst Technol, Newark, NJ 07102 USA
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中图分类号
O646 [电化学、电解、磁化学];
学科分类号
081704 ;
摘要
The temperature dependency of the growth kinetics for the synthesis of silicon carbide, silicon nitride and silicon are reviewed. In general, there is a low temperature region, which follows an Arrhenius type behavior follow by a region with very little temperature dependency. It is postulated that in the temperature region where the Arrhenius type behavior is followed that the deposition rate in all three cases is controlled by the desorption of hydrogen brought to the surface by the silicon, nitrogen, or carbon atoms which are used to grow the film.
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页码:623 / 631
页数:9
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