A trinomial test for paired data when there are many ties

被引:13
|
作者
Bian, Guorui [3 ]
McAleer, Michael [4 ,5 ,6 ]
Wong, Wing-Keung [1 ,2 ]
机构
[1] Hong Kong Baptist Univ, Dept Econ, Hong Kong, Hong Kong, Peoples R China
[2] Hong Kong Baptist Univ, Inst Computat Math, Hong Kong, Hong Kong, Peoples R China
[3] E China Normal Univ, Dept Stat, Shanghai, Peoples R China
[4] Erasmus Univ, Erasmus Sch Econ, Inst Econometr, Rotterdam, Netherlands
[5] Tinbergen Inst, Amsterdam, Netherlands
[6] Kyoto Univ, Inst Econ Res, Kyoto 6068501, Japan
基金
日本学术振兴会; 澳大利亚研究理事会;
关键词
Sign test; Trinomial test; Non-parametric test; Ties; Test statistics; NUISANCE PARAMETER; SIGN TEST; VERSIONS;
D O I
10.1016/j.matcom.2010.11.002
中图分类号
TP39 [计算机的应用];
学科分类号
081203 ; 0835 ;
摘要
This paper develops a new test, the trinomial test, for pairwise ordinal data samples to improve the power of the sign test by modifying its treatment of zero differences between observations, thereby increasing the use of sample information. Simulations demonstrate the power superiority of the proposed trinomial test statistic over the sign test in small samples in the presence of tie observations. We also show that the proposed trinomial test has substantially higher power than the sign test in large samples and also in the presence of tie observations, as the sign test ignores information from observations resulting in ties. (C) 2010 IMACS. Published by Elsevier B.V. All rights reserved.
引用
收藏
页码:1153 / 1160
页数:8
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