Size dependent structural, optical and morphological properties of ZnS:Cu thin films

被引:18
|
作者
Kumaran, S. Muthu [1 ]
Kumar, M. Ashok [2 ]
机构
[1] HH Rajahs Coll, Dept Phys, Pudukkottai 622001, Tamilnadu, India
[2] Srinivasan Coll Arts & Sci, Dept Phys, Perambalur 621212, Tamilnadu, India
关键词
Zinc sulfide - Deposition - Thin films - X ray diffraction - Energy gap - Glass substrates - Scanning electron microscopy - II-VI semiconductors - Light absorption;
D O I
10.1007/s10854-011-0497-4
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
ZnS:Cu thin films have been deposited on glass substrate by a simple neutral pH solution synthesis route and chemical bath deposition technique. The copper concentration was varied between 0 and 0.1 M%. The X-ray diffraction and scanning electron microscope studies show the average size of the nanoparticles are below 4 nm (Bohr diameter). The effect of film thickness on the optical and structural properties has been studied. The optical absorption studies show the band gap energy of ZnS: Cu films decreases from 3.68 to 3.43 eV as thickness varied from 318.3 to 334.1 nm. The structural estimation shows the variation in particle size from 2.67 to 3.14 nm with thickness. The insignificant change in band gap may be due to the increase in particle size and quantum size effect.
引用
收藏
页码:811 / 815
页数:5
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