The scanning electron microscopy of hot and electron-emitting specimens

被引：0
|
作者：
Ahmed, H [1 ]
机构：
[1] Univ Cambridge, Cavendish Lab, Cambridge CB2 1TN, England
[2] Univ Cambridge, Dept Engn, Cambridge CB2 1TN, England
来源：
ADVANCES IN IMAGING AND ELECTRON PHYSICS, VOL 133 | 2004年 / 133卷
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中图分类号：
O59 [应用物理学];
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摘要：
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页码：179 / 185
页数：7
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