Application of a VUV Fourier transform spectrometer and synchrotron radiation source to measurements of.: VI.: The ε(0,0) band of NO

被引:7
|
作者
Cheung, ASC [1 ]
Wong, AL
Lo, DHY
Leung, KWS
Yoshino, K
Thorne, AP
Murray, JE
Imajo, T
Ito, K
Matsui, T
机构
[1] Univ Hong Kong, Dept Chem, Hong Kong, Hong Kong, Peoples R China
[2] Harvard Smithsonian Ctr Astrophys, Cambridge, MA 02138 USA
[3] Univ London Imperial Coll Sci Technol & Med, Blackett Lab, London SW7 2BZ, England
[4] Japan Womens Univ, Tokyo 1128681, Japan
[5] Natl Lab High Energy Phys, KEK, Photon Factory, Tsukuba, Ibaraki 305, Japan
来源
JOURNAL OF CHEMICAL PHYSICS | 2003年 / 119卷 / 16期
关键词
D O I
10.1063/1.1611171
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
The epsilon(0,0) (D (2)Sigma(+)-X (2)Pi(r)) band of NO has been recorded by using a vacuum ultraviolet Fourier transform spectrometer from Imperial College, London, with synchrotron radiation at the Photon Factory, KEK, Japan, as a continuum light source. Analysis of the epsilon(0,0) band provides accurate rotational line positions and term values as well as the photoabsorption cross sections. Molecular constants of the v=0 level of the D (2)Sigma state have been determined as T-0=53 291.10+/-0.10 cm(-1), B-0=1.991 07+/-0.000 05 cm(-1), and D-0=(6.6+/-0.1)x10(-6) cm(-1). Accurate rotational line strengths have also been obtained and the sum of the line strengths for all rotational lines is determined as 2.18x10(-15) cm(2) cm(-1). The band oscillator strength of the epsilon(0,0) band is determined to be (2.47+/-0.12)x10(-3). (C) 2003 American Institute of Physics.
引用
收藏
页码:8373 / 8378
页数:6
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