Transverse and longitudinal characterization of electron beams using interaction with optical near-fields

被引：8

作者：

Kozak, Martin ^{[1
]}

McNeur, Joshua ^{[1
]}

Leedle, Kenneth J. ^{[2
]}

Deng, Huiyang ^{[2
]}

Schoenenberger, Norbert ^{[1
]}

Ruehl, Axel ^{[3
]}

Hartl, Ingmar ^{[3
]}

Hoogland, Heinar ^{[1
,4
]}

Holzwarth, Ronald ^{[4
]}

Harris, James S. ^{[2
,5
]}

Byer, Robert L. ^{[2
]}

Hommelhoff, Peter ^{[1
,6
]}

机构：

[1] Univ Erlangen Nurnberg, Dept Phys, Staudtstr 1, D-91058 Erlangen, Germany

[2] Stanford Univ, Dept Elect Engn, Stanford, CA 94305 USA

[3] DESY, D-22607 Hamburg, Germany

[4] Menlo Syst GmbH, Klopferspitz 19a, D-82152 Martinsried, Germany

[5] Stanford Univ, Dept Appl Phys, Stanford, CA 94305 USA

[6] Max Planck Inst Sci Light, Gunther Scharowsky Str 1, D-91058 Erlangen, Germany

来源：

OPTICS LETTERS | 2016年 / 41卷 / 15期

基金：

欧洲研究理事会;

关键词：

FEMTOSECOND; DIFFRACTION; ACCELERATION; PULSES;

D O I：

10.1364/OL.41.003435

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

We demonstrate an experimental technique for both transverse and longitudinal characterization of bunched femtosecond free electron beams. The operation principle is based on monitoring of the current of electrons that obtained an energy gain during the interaction with the synchronized optical near-field wave excited by femtosecond laser pulses. The synchronous accelerating/decelerating fields confined to the surface of a silicon nanostructure are characterized using a highly focused sub-relativistic electron beam. Here the transverse spatial resolution of 450 nm and femtosecond temporal resolution of 480 fs (sub-optical-cycle temporal regime is briefly discussed) achievable by this technique are demonstrated. (C) 2016 Optical Society of America

引用

页码：3435 / 3438

页数：4

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