Depth profile of titanium alloy (Ti-6Al-4V) and residual stress measured by using X-ray diffraction after metal cutting assisted high-pressured jet cooling evaluation of etching methods: ION beam (EDOS) and electro-chemical etching

被引：4
|
作者：
Vosough, M [1 ]
Liu, P [1 ]
Svenningsson, I [1 ]
机构：
[1] Lulea Univ Technol, S-95187 Lulea, Sweden
来源：
RESIDUAL STRESSES VII, PROCEEDINGS | 2005年 / 490-491卷
关键词：
aerospace material; titanium (Ti-6Al-4V); turning; residual stress; X-ray diffraction;
D O I：
10.4028/www.scientific.net/MSF.490-491.545
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
引用
收藏
页码：545 / 551
页数：7
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