March SL: A test for all static linked memory faults

被引：0
|
作者：
Hamdioui, S [1 ]
Al-Ars, Z [1 ]
van de Goor, AJ [1 ]
Rodgers, M [1 ]
机构：
[1] Delft Univ Technol, Fac Informat Technol & Syst, Comp Engn Lab, NL-2628 CD Delft, Netherlands
来源：
ATS 2003: 12TH ASIAN TEST SYMPOSIUM, PROCEEDINGS | 2003年
关键词：
memory testing; linked faults; functional fault models; march tests; fault coverage;
D O I：
暂无
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
The analysis of linked faults has proven to be a source for new memory tests, characterized by an increased fault coverage. The paper gives a set of five new tests to target all possible linked faults. The tests are merged into a single test, March SL, detecting all faults in the linked fault space. The preliminary test results of an experiment done at Intel will be reported; they show that March SL scores high and detects some unique faults.
引用
收藏
页码：372 / 377
页数：6
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