Negative Phase Shift in a Layered Metal-Dielectric Structure: Theory and Experiment

被引：0
|
作者：
Agashkov, A. [1 ]
Belyi, V. [1 ]
Binhussain, M. A. [2 ]
Kazak, N. [1 ]
Agabekov, V. [3 ]
Khilo, N. [1 ]
机构：
[1] NAS Belarus, Inst Phys, 68 Nezalezhnasti Ave, Minsk 220072, BELARUS
[2] KACST, Natl Ctr Bldg & Construct Technol, Riyadh 11442, Saudi Arabia
[3] NAS Belarus, Inst Chem New Mat, Minsk 220141, BELARUS
来源：
9TH INTERNATIONAL CONGRESS ON ADVANCED ELECTROMAGNETIC MATERIALS IN MICROWAVES AND OPTICS (METAMATERIALS 2015) | 2015年
关键词：
INDEX;
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Measurements of the negative optical phase shifts of Ag/TiO2 and Ag/SiO2 bilayer films have been carried out with the modified walk-off interferometer. Appearance and monotonic rise of the phase shift anisotropy for p- and s-polarization by increasing incidence angle has been revealed experimentally. The results of measurements have shown rather good coincidence with theoretical calculations.
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页码：25 / 27
页数：3
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