Analysis of some coins by energy dispersive X-ray fluorescence (EDXRF) and high energy particle induced X-ray emission (PIXE) techniques

被引：19
|
作者：
Santra, S
Mitra, D
Sarkar, M
Bhattacharya, D
Denker, A
Opitz-Coutureau, J
Rauschenberg, J
机构：
[1] Saha Inst Nucl Phys, Nucl & Atom Phys Div, Kolkata 700064, W Bengal, India
[2] HMI, Berlin, Germany
来源：
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 2005年 / 229卷 / 3-4期
关键词：
EDXRF; high energy PIXE; coin analysis;
D O I：
10.1016/j.nimb.2004.12.125
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
15 Indian coins have been analysed with energy dispersive X-ray fluorescence (EDXRF) and high energy particle induced X-ray emission (PIXE) techniques. A comparison of the analysis shows that the results obtained by these two techniques are in good agreement with each other. (c) 2005 Elsevier B.V. All rights reserved.
引用
收藏
页码：465 / 470
页数：6
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