Ablation of polymers by focused EUV radiation from a table-top laser-produced plasma source

被引:5
|
作者
Barkusky, Frank [1 ]
Bayer, Armin [1 ]
Mann, Klaus [1 ]
机构
[1] Laser Lab Gottingen eV, D-37077 Gottingen, Germany
来源
关键词
EXTREME-ULTRAVIOLET PLASMAS; EXCIMER; PMMA; FABRICATION; EXCITATION;
D O I
10.1007/s00339-011-6540-8
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We have investigated ablation of polymers with radiation of 13.5 nm wavelength, using a table-top laser produced plasma source based on solid gold as target material. A Schwarzschild objective with Mo/Si multilayer coatings was adapted to the source, generating an EUV spot of 5 mu m diameter with a maximum energy density of similar to 1.3 J/cm(2). In combination with a Zirconium transmission filter, radiation of high spectral purity (2% bandwidth) can be provided on the irradiated spot. Ablation experiments were performed on PMMA, PTFE and PC. Ablation rates were determined for varying fluences using atomic force microscopy and white light interferometry. The slopes of these curves are discussed with respect to the chemical structure of the polymers. Additionally, the ablation behavior in terms of effective penetration depths, threshold fluences and incubation effects is compared to literature data for higher UV wavelength.
引用
收藏
页码:17 / 23
页数:7
相关论文
共 50 条
  • [1] Ablation of polymers by focused EUV radiation from a table-top laser-produced plasma source
    Frank Barkusky
    Armin Bayer
    Klaus Mann
    Applied Physics A, 2011, 105 : 17 - 23
  • [2] Damage threshold measurements on EUV optics using focused radiation from a table-top laser produced plasma source
    Barkusky, Frank
    Bayer, Armin
    Doering, Stefan
    Grossmann, Peter
    Mann, Klaus
    OPTICS EXPRESS, 2010, 18 (05): : 4346 - 4355
  • [3] Direct structuring of solids by EUV radiation from a table-top laser produced plasma source
    Barkusky, Frank
    Bayer, Armin
    Peth, Christian
    Mann, Klaus
    DAMAGE TO VUV, EUV, AND X-RAY OPTICS II, 2009, 7361
  • [4] Damage testing of EUV optics using focused radiation from a table-top LPP source
    Mann, K.
    Barkusky, F.
    Bayer, A.
    Doering, S.
    EXTREME ULTRAVIOLET (EUV) LITHOGRAPHY II, 2011, 7969
  • [5] Damage testing of EUV Optics and Sensors using focused Radiation from a table-top LPP Source
    Mann, Klaus
    Barkusky, Frank
    Bayer, Armin
    Floeter, Bernhard
    Grossmann, Peter
    EXTREME ULTRAVIOLET (EUV) LITHOGRAPHY, 2010, 7636
  • [6] Optimization of EUV radiation yield from laser-produced plasma
    Düsterer, S
    Schwoerer, H
    Ziegler, W
    Ziener, C
    Sauerbrey, R
    APPLIED PHYSICS B-LASERS AND OPTICS, 2001, 73 (07): : 693 - 698
  • [7] Optimization of EUV radiation yield from laser-produced plasma
    S. Düsterer
    H. Schwoerer
    W. Ziegler
    C. Ziener
    R. Sauerbrey
    Applied Physics B, 2001, 73 : 693 - 698
  • [8] The development of laser-produced plasma EUV light source
    Yang, De-Kun
    Wang, Du
    Huang, Qiu-Shi
    Song, Yi
    Wu, Jian
    Li, Wen-Xue
    Wang, Zhan-Shan
    Tang, Xia-Hui
    Xu, Hong-Xing
    Liu, Sheng
    Gui, Cheng-Qun
    CHIP, 2022, 1 (03):
  • [9] Development of EUV light source by laser-produced plasma
    Izawa, Y.
    Miyanaga, N.
    Nishimura, H.
    Fujioka, S.
    Aota, T.
    Tao, Y.
    Uchida, S.
    Shimada, Y.
    Hashimoto, K.
    Yamaura, M.
    Nishihara, K.
    Murakami, M.
    Sunahara, A.
    Furukawa, H.
    Sasaki, A.
    Nishikawa, W.
    Tanuma, H.
    Norimatsu, T.
    Nagai, K.
    Gu, Q.
    Nakatsuka, M.
    Fujita, H.
    Tsubakimoto, K.
    Yoshida, H.
    Mima, K.
    JOURNAL DE PHYSIQUE IV, 2006, 133 : 1161 - 1165
  • [10] Laser-produced plasma source development for EUV lithography
    Endo, Akira
    Komori, Hiroshi
    Ueno, Yoshifumi
    Nowak, Krzysztof M.
    Takayuki, Yabu
    Tatsuya, Yanagida
    Suganuma, Takashi
    Asayama, Takeshi
    Someya, Hiroshi
    Hoshino, Hideo
    Nakano, Masaki
    Moriya, Masato
    Nishisaka, Toshihiro
    Abe, Tamotsu
    Sumitani, Akira
    Nagano, Hitoshi
    Sasaki, Youichi
    Nagai, Shinji
    Watanabe, Yukio
    Soumagne, Georg
    Ishihara, Takanobu
    Wakabayashi, Osamu
    Kakizaki, Kouji
    Mizoguchi, Hakaru
    ALTERNATIVE LITHOGRAPHIC TECHNOLOGIES, 2009, 7271