Impact of radiation-induced soft error on embedded cryptography algorithms

被引：6
|
作者：
Bandeira, Vitor [1 ]
Sampford, Jack [2 ]
Garibotti, Rafael [3 ]
Trindade, Matheus Garay [4 ,5 ]
Bastos, Rodrigo Possamai [4 ,5 ]
Reis, Ricardo [1 ]
Ost, Luciano [6 ]
机构：
[1] Univ Fed Rio Grande do Sul, Inst Informat, PGMicro, Porto Alegre, RS, Brazil
[2] Phixos, Worcester, England
[3] Pontificia Univ Catolica Rio Grande do Sul, Sch Technol, Porto Alegre, RS, Brazil
[4] Univ Grenoble Alpes, CNRS, Grenoble INP, TIMA, F-38000 Grenoble, France
[5] Univ Grenoble Alpes, Inst Engn, Grenoble, France
[6] Loughborough Univ, Wolfson Sch, Loughborough, Leics, England
来源：
MICROELECTRONICS RELIABILITY | 2021年 / 126卷
关键词：
Radiation test; Reliability; FPGA; XTEA; AES; Cryptography; Radiation-induced soft errors; ENCRYPTION;
D O I：
10.1016/j.microrel.2021.114349
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
With the advance of autonomous systems, security is becoming the most crucial feature in different domains, highlighting the need for protection against potential attacks. Mitigation of these types of attacks can be achieved using embedded cryptography algorithms, which differ in performance, area, and reliability. This paper compares hardware implementations of the eXtended Tiny Encryption Algorithm (XTEA) and the Advanced Encryption Standard (AES) algorithms. Results show that the XTEA implementation gives the best relative performance (e.g., throughput, power), area, and soft error reliability trade-offs.
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收藏
页数：5
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