Impedance spectroscopy analysis of Ba0.7Sr03TiO3/La0.7Sr0.3MnO3 heterostructure
被引:94
|
作者:
Martinez, R.
论文数: 0引用数: 0
h-index: 0
机构:
Univ Puerto Rico, Dept Phys, San Juan, PR 00931 USA
Univ Puerto Rico, Inst Funct Nanomat, San Juan, PR 00931 USAUniv Puerto Rico, Dept Phys, San Juan, PR 00931 USA
Martinez, R.
[1
,2
]
论文数: 引用数:
h-index:
机构:
Kumar, A.
[1
,2
]
Palai, R.
论文数: 0引用数: 0
h-index: 0
机构:
Univ Puerto Rico, Dept Phys, San Juan, PR 00931 USA
Univ Puerto Rico, Inst Funct Nanomat, San Juan, PR 00931 USAUniv Puerto Rico, Dept Phys, San Juan, PR 00931 USA
Palai, R.
[1
,2
]
Scott, J. F.
论文数: 0引用数: 0
h-index: 0
机构:
Univ Puerto Rico, Dept Phys, San Juan, PR 00931 USA
Univ Puerto Rico, Inst Funct Nanomat, San Juan, PR 00931 USA
Univ Cambridge, Cavendish Lab, Dept Phys, Cambridge CB3 0HE, EnglandUniv Puerto Rico, Dept Phys, San Juan, PR 00931 USA
Scott, J. F.
[1
,2
,3
]
Katiyar, R. S.
论文数: 0引用数: 0
h-index: 0
机构:
Univ Puerto Rico, Dept Phys, San Juan, PR 00931 USA
Univ Puerto Rico, Inst Funct Nanomat, San Juan, PR 00931 USAUniv Puerto Rico, Dept Phys, San Juan, PR 00931 USA
Katiyar, R. S.
[1
,2
]
机构:
[1] Univ Puerto Rico, Dept Phys, San Juan, PR 00931 USA
[2] Univ Puerto Rico, Inst Funct Nanomat, San Juan, PR 00931 USA
Impedance spectroscopy technique has been used to study the effect of grains and grain boundaries in a heterostructure constituted with ferromagnetic La0.7Sr0.3MnO3 (LSMO) and ferroelectric Ba0.7Sr0.3TiO3 (BST) layers grown by pulsed laser deposition technique on (1 0 0) oriented MgO substrate. Frequency and temperature dependence of the complex impedance and complex electric modulus were measured in (BST20u.c,/LSMO10u.c)(25) over a temperature range of 360-500 K. Non-Debye relaxation was observed in the investigated system. An equivalent circuit and the modified constant phase element circuit were used to describe the impedance spectroscopy, and excellent agreement between the calculated and measured curves was obtained from each model. The activation energy (similar to 0.25 eV-0.48 eV) has been obtained from Arrhenius fitting of different relaxation processes present in the material, and its characteristic values support a model of Maxwell-Wagner relaxation in the heterostructured film at elevated temperatures and in the low frequency range. The electrical ac and dc conductivity studies showed that the heterostructure possesses negative temperature coefficient of resistance properties. It was found that the resistance of grain boundaries was larger than the resistance of intra-grains.
机构:
Sorbonne Univ, CNRS UMR 7588, Inst Nano Sci Paris INSP, 4 Pl Jussieu, F-75252 Paris 05, FranceSorbonne Univ, CNRS UMR 7588, Inst Nano Sci Paris INSP, 4 Pl Jussieu, F-75252 Paris 05, France
Hebert, Christian
论文数: 引用数:
h-index:
机构:
Hrabovsky, David
Becerra, Loic
论文数: 0引用数: 0
h-index: 0
机构:
Sorbonne Univ, CNRS UMR 7588, Inst Nano Sci Paris INSP, 4 Pl Jussieu, F-75252 Paris 05, FranceSorbonne Univ, CNRS UMR 7588, Inst Nano Sci Paris INSP, 4 Pl Jussieu, F-75252 Paris 05, France
Becerra, Loic
Jedrecy, Nathalie
论文数: 0引用数: 0
h-index: 0
机构:
Sorbonne Univ, CNRS UMR 7588, Inst Nano Sci Paris INSP, 4 Pl Jussieu, F-75252 Paris 05, FranceSorbonne Univ, CNRS UMR 7588, Inst Nano Sci Paris INSP, 4 Pl Jussieu, F-75252 Paris 05, France
机构:
Penn State Univ, Dept Phys, University Pk, PA 16802 USA
Univ Sci & Technol China, Dept Phys, Hefei Natl Lab Phys Sci Microscale, Hefei 230026, Peoples R ChinaPenn State Univ, Dept Phys, University Pk, PA 16802 USA
Yin, Y. W.
Raju, M.
论文数: 0引用数: 0
h-index: 0
机构:
Penn State Univ, Dept Phys, University Pk, PA 16802 USAPenn State Univ, Dept Phys, University Pk, PA 16802 USA
Raju, M.
Hu, W. J.
论文数: 0引用数: 0
h-index: 0
机构:
Penn State Univ, Dept Phys, University Pk, PA 16802 USAPenn State Univ, Dept Phys, University Pk, PA 16802 USA
Hu, W. J.
Weng, X. J.
论文数: 0引用数: 0
h-index: 0
机构:
Penn State Univ, Dept Mat Sci & Engn, Mat Res Inst, University Pk, PA 16802 USAPenn State Univ, Dept Phys, University Pk, PA 16802 USA
Weng, X. J.
Li, X. G.
论文数: 0引用数: 0
h-index: 0
机构:
Univ Sci & Technol China, Dept Phys, Hefei Natl Lab Phys Sci Microscale, Hefei 230026, Peoples R ChinaPenn State Univ, Dept Phys, University Pk, PA 16802 USA
Li, X. G.
Li, Q.
论文数: 0引用数: 0
h-index: 0
机构:
Penn State Univ, Dept Phys, University Pk, PA 16802 USAPenn State Univ, Dept Phys, University Pk, PA 16802 USA
机构:
Univ Puerto Rico, Dept Phys, San Juan, PR 00936 USA
Univ Puerto Rico, Inst Funct Nanomat, San Juan, PR 00936 USANatl Phys Lab, Mat Phys & Engn Div, Delhi 110012, India
Martinez, R.
Kumar, A.
论文数: 0引用数: 0
h-index: 0
机构:
Natl Phys Lab, Mat Phys & Engn Div, Delhi 110012, IndiaNatl Phys Lab, Mat Phys & Engn Div, Delhi 110012, India
Kumar, A.
Palai, R.
论文数: 0引用数: 0
h-index: 0
机构:
Univ Puerto Rico, Dept Phys, San Juan, PR 00936 USA
Univ Puerto Rico, Inst Funct Nanomat, San Juan, PR 00936 USANatl Phys Lab, Mat Phys & Engn Div, Delhi 110012, India
Palai, R.
Srinivasan, G.
论文数: 0引用数: 0
h-index: 0
机构:
Oakland Univ, Dept Phys, Rochester, MI 48309 USANatl Phys Lab, Mat Phys & Engn Div, Delhi 110012, India
Srinivasan, G.
Katiyar, R. S.
论文数: 0引用数: 0
h-index: 0
机构:
Univ Puerto Rico, Dept Phys, San Juan, PR 00936 USA
Univ Puerto Rico, Inst Funct Nanomat, San Juan, PR 00936 USANatl Phys Lab, Mat Phys & Engn Div, Delhi 110012, India