Probing relaxations of atomic-scale junctions in the Pauli repulsion range

被引:5
|
作者
Brand, J. [1 ]
Neel, N. [1 ]
Kroeger, J. [1 ]
机构
[1] Tech Univ Ilmenau, Inst Phys, D-98693 Ilmenau, Germany
来源
NEW JOURNAL OF PHYSICS | 2019年 / 21卷 / 10期
关键词
atomic force microscopy; scanning tunnelling microscopy; single-molecule junction; C60; surface physics; adsorption; surface chemistry; FORCE MICROSCOPY; SINGLE-ATOM; C-60; CONDUCTANCE; TIP; SURFACE; MAGNETORESISTANCE; POLARIZABILITY; PHOTOEMISSION; ENERGY;
D O I
10.1088/1367-2630/ab4c84
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
Clean metal as well as C60-terminated tips of an atomic force microscope probe the interaction with C60 molecules adsorbed on Cu(111) and Pb(111). The force measurements unveil a monotonic shift of the point of maximum attraction with the bias voltage. The conventional superposition of long-range van der Waals and electrostatic forces with short-range Pauli repulsion does not reproduce the shift. By phenomenologically including bias-dependent relaxations of the electrode geometry in the analytical expression for the short-range force the experimental data can qualitatively be described.
引用
收藏
页数:10
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