Lifetime Prediction Based on Degradation Data Analysis with a Change Point

被引:1
|
作者
Wang, Haowei [1 ]
Xu, Tingxue [2 ]
Yang, Jikun [1 ]
机构
[1] NAAU, Dept Grad Students Brigade, Yantai 264001, Shandong, Peoples R China
[2] NAAU, Dept Ordnance Sci & Technol, Yantai 264001, Shandong, Peoples R China
关键词
Lifetime prediction; Degradation model; Changepoint; ACCELERATED DEGRADATION;
D O I
10.1007/978-3-642-54233-6_58
中图分类号
V [航空、航天];
学科分类号
08 ; 0825 ;
摘要
To predict the lifetime based on degradation data analysis has been widely studied. The accuracy of lifetime prediction largely depends on whether the degradation model is appropriate or not. For some products, there is a change point in the degradation process, and the entire degradation process can be divided into two phases by the change point. Motivated by an example of resistors, we studied the difference of several modeling approaches with nonlinear gamma and wiener process. The result indicated that modeling the process after the change point obtained more reasonable estimations in the example.
引用
收藏
页码:527 / 534
页数:8
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