Possibilities of surface relief determination by photometric method in millimeter and submillimeter wavelength range

被引：0
|
作者：
Dulova, I. A. [1 ]
Komienko, Yu. V. [1 ]
Skuratovskiy, S. I. [1 ]
机构：
[1] NAS Ukraine, Usikov Inst Radiophys & Elect, 12 Proskura Str, UA-61085 Kharkov, Ukraine
来源：
SIXTH INT KHARKOV SYMPOSIUM ON PHYSICS AND ENGINEERING OF MICROWAVES, MILLIMETER AND SUBMILLIMETER WAVES/WORKSHOP ON TERAHERTZ TECHNOLOGIES, VOLS 1 AND 2 | 2007年
关键词：
D O I：
10.1109/MSMW.2007.4294807
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：766 / +
页数：2
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