Weld defect extraction based on adaptive morphology filtering and edge detection by wavelet analysis

被引:0
|
作者
Wang, DH [1 ]
Zhou, YH
Gang, T
机构
[1] Shanghai Jiao Tong Univ, Shanghai 200030, Peoples R China
[2] Harbin Inst Technol, Harbin 150001, Peoples R China
来源
CHINESE JOURNAL OF ELECTRONICS | 2003年 / 12卷 / 03期
关键词
image processing; morphology filtering; wavelet analysis; X-ray inspection;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
One of the most key steps in X-ray automatic inspection and intelligent recognition systems is how to extract defects and detect their edges effectively. In this paper, a novel method of defect extraction based on the adaptive morphology filtering (DEAMF) is proposed, whose structuring elements can be changed with the sizes of defects adaptively. By this method, defects in X-ray weld inspection images are extracted with well-kept shapes and high speeds. Then according to the theory of edge detection based on wavelet transform modulus maxima, a locally supported wavelet with good antisymmetry is developed to extract edges of defects and the results are satisfying.
引用
收藏
页码:335 / 339
页数:5
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