Performance modeling of analog integrated circuits using least-squares support vector machines

被引:43
|
作者
Kiely, T [1 ]
Gielen, G [1 ]
机构
[1] Katholieke Univ Leuven, Dept Elect Engn, ESAT, MICAS, B-3001 Louvain, Belgium
关键词
D O I
10.1109/DATE.2004.1268887
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
This paper describes the application of Least-Squares Support Vector Machine (LS-SVM) training to analog circuit performance modeling as needed for accelerated or hierarchical analog circuit synthesis. The training is a type of regression, where a function of a special form is fit to experimental performance data derived from analog circuit simulations. The method is contrasted with a feasibility, model approach based on the more traditional use of SVMs, namely classification. A Design of Experiments (DOE) strategy, is reviewed which forms the basis of an efficient simulation sampling scheme. The results of our functional regression are then compared to two other DOE-based fitting schemes: a simple linear least-squares regression and a regression using posynomial models. The LS-SVM fitting has advantages over these approaches in terms of accuracy of fit to measured data, prediction of intermediate data points and reduction of free model timing parameters.
引用
收藏
页码:448 / 453
页数:6
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