共 50 条
- [1] Electromigration in Eutectic Tin-Bismuth Bottom-Terminated-Component Solder Joints PROCEEDINGS OF THE IEEE 74TH ELECTRONIC COMPONENTS AND TECHNOLOGY CONFERENCE, ECTC 2024, 2024, : 1433 - 1438
- [2] TEM study of Bi segregation in the interconnect of eutectic tin-bismuth solder and copper ICEPT: 2007 8TH INTERNATIONAL CONFERENCE ON ELECTRONICS PACKAGING TECHNOLOGY, PROCEEDINGS, 2007, : 765 - 767
- [5] Partially-constrained thermomechanical fatigue of eutectic tin-bismuth/copper solder joints Journal of Electronic Materials, 1999, 28 : 1045 - 1054
- [7] Partially-constrained thermomechanical fatigue of eutectic tin-bismuth copper electronic solder joints CREEP AND STRESS RELAXATION IN MINIATURE STRUCTURES AND COMPONENTS, 1996, : 233 - 251
- [8] ANISOTROPY OF SUPERPLASTIC PROPERTIES OF EUTECTIC TIN-BISMUTH ALLOY ZEITSCHRIFT FUR METALLKUNDE, 1979, 70 (09): : 573 - 576
- [9] Tin, Bismuth, and Tin-Bismuth Alloy Electrodeposition from Chlorometalate Salts in Deep Eutectic Solvents CHEMISTRYOPEN, 2017, 6 (03): : 393 - 401