Near-field measurement of ZnS:Mn nanocrystal and bulk thin-film electroluminescent devices

被引：7
|
作者：
Grmela, L. [1 ]
Macku, R. [1 ]
Tomanek, P. [1 ]
机构：
[1] Brno Univ Technol, Fac Elect Engn & Commun, Dept Phys, Brno 61600, Czech Republic
来源：
JOURNAL OF MICROSCOPY-OXFORD | 2008年 / 229卷 / 02期
关键词：
electroluminescence; luminescence centres; nanocrystal; phosphor; photoluminescence; scanning near-field optical microscopy; ZnS : Mn;
D O I：
10.1111/j.1365-2818.2008.01900.x
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
A near-field study of the electro-optical phenomena and aging characteristics of nanostructured and bulk ZnS:Mn alternating-current thin-film electro-optical devices is presented. ZnS:Mn nanocrystals embedded in the glass matrices as well as ZnS:Mn thin-film phosphors contain four different concentrations of Mn (from 0.05 to 1.0 mol%). The activator impurity in the phosphor influences the spectral properties and, to a large extent, the temporal properties of optical emission and an aging process of the devices. Therefore, a local photoluminescence and electroluminescence investigation using a scanning near-field optical microscope technique is provided and the aging characteristics of ZnS:Mn nanocrystal structure also presented.
引用
收藏
页码：275 / 280
页数：6
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