Soft ESD phenomena in GMR heads in the HDD manufacturing process

被引:7
|
作者
Mizoh, Y
Nakano, T
Tagashira, K
Nakamura, K
Suzuki, T
机构
[1] Matsushita Kotobuki Elect Ind Ltd, Saijo, Ehime 7938510, Japan
[2] Matsushita Kotobuki Elect Ind Ltd, Ipponmatsu, Ehime 79833965, Japan
关键词
EDS; GMR heads; HDD manufacturing;
D O I
10.1016/j.elstat.2005.03.090
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
GMR (giant magnetoresistive) heads used for HDD (hard disk drives) are very sensitive to ESD (electrostatic discharge). Some kinds of ESD damages will cause soft magnetic degradations of head performance with a progressive nature. We report examples of head degradations by ESD damages as well as other damages due to head scratches, electro-migration effects and corrosion of GMR stack. It is usually very difficult to distinguish these phenomena explicitly by QST (quasistatic tester) and spinstand measurement test. We show that head scratches can cause damages similar to damages caused by ESD and that re-magnetization has certain potential to correct the damaged magnetic structure caused by such scratches. (c) 2005 Elsevier B.V. All rights reserved.
引用
收藏
页码:72 / 79
页数:8
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