X-RAY DIFFRACTION OF VERY SMALL SAMPLES AT EXTREME CONDITIONS OF PRESSURE AND TEMPERATURE

被引：0
|
作者：
Fiquet, G. [1 ]
Andrault, D. [1 ]
Itie, J. P. [1 ]
Richet, P. [1 ]
Gillet, P. [1 ]
Hausermann, D. [1 ]
Hanfland, M. [1 ]
机构：
[1] ENS Lyon, Lab Sci Terre, F-69364 Lyon 07, France
来源：
ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES | 1996年 / 52卷
关键词：
D O I：
10.1107/S0108767396078312
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
MS18.02.05
引用
收藏
页码：C532 / C532
页数：1
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