Composition and temperature dependence of the refractive index in Hg1-xCdxTe over the visible light region

被引：0
|
作者：
Jiang, RQ [1 ]
Xia, YY [1 ]
Zhang, Y [1 ]
Fang, JX [1 ]
机构：
[1] Shandong Univ, Infrared & Remote Sensing Res Lab, Jinan 250100, Peoples R China
来源：
DETECTORS, FOCAL PLANE ARRAYS, AND IMAGING DEVICES II | 1998年 / 3553卷
关键词：
HgCdTe; refractive index; E-1(x; T); ellipsometry;
D O I：
10.1117/12.318091
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
We measured refractive index of n type Hg1-xCdxTe with the null ellipsometric spectrum method over the visible light region, and the dispersion spectra with compositions x ranging from 0.2 to 0.46 have been obtained at different temperature. The reflectivity has been calculated in the wavelength region above the absorption edge at temperatures from 77K to 300K. A peak over the visible light region appears just at the wavelength corresponding to the band-gap energy E-1(x,T) of Hg1-xCdxTe. E-1(x,T) can be described by an empirical formula.
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页码：33 / 36
页数：4
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