Application of Micro X-Ray Fluorescence Imaging Technology in Core Analysis

Micro-XRF analysis technology is one of the non-destructive analysis methods that use tiny X-Ray beams to irradiate samples and then analyze fluorescence spectra and observe the components of the samples. It has the characteristics of high sensitivity, high efficiency and high accuracy. In this experiment, The Micro-XRF spectrometer (M6 JETSTREAM) was used to scan the core samples of the ZK3801 drilling in Dongguashan copper mine, Anhui province. It can analyze the distribution characteristics and combination relationships of 17 elements in different parts. The results show that (1)The high-value spatial distribution regions of Cu and Fe do not overlap basically, and the distribution ranges of S and Fe are highly overlapped, Ni, Bi, Pb, Zn, Si and Na are closely related to Cu, while Ti, Al and K have a weak correlation with Fe; (2)In the vertical direction, as increasing depth, the content of Fe increases gradually, while the content of Cu and other elements shows a decreasing trend; (3) The element distribution is modified by the middle Carboniferous submarine jet sedimentation and mineralization and magmatic-hydrothermal mineralization; (4) The ore minerals of the drill hole are mainly pyrrhotite, chalcopyrite and pyrite, with a certain combination law in the vertical direction. The gangue minerals are mainly quartz, garnet and diopside; Analyzing the spatial distribution of elements, correlations, and mineral combinations and distribution relationships can provide new understanding and new evidence for the enrichment and migration of elements, mineralization mechanisms, genetic models, and environmental, geological processes. Moreover, combined with the distribution pattern of the geochemical halo of the deposit, trace elements can be used as indicator elements to find the main mineral species and provide a basis for deep prospecting. Additionally, it can filter out the information and location that we are interested in quickly. It can provide powerful technical support for different scales and different levels of requirements for screening various fine parameters in the later stage.