Development of confocal micro X-ray fluorescence instrument using two X-ray beams

被引：51
|
作者：
Tsuji, Kouichi
Nakano, Kazuhiko
Ding, Xunliang
机构：
[1] Osaka City Univ, Grad Sch, Dept Appl Chem, Sumiyoshi Ku, Osaka 5588585, Japan
[2] Japan Sci & Technol Agcy, PRESTO, Kawagoe, Saitama 3320012, Japan
[3] Beijing Normal Univ, Inst Low Energy Nucl Phys, Xray Opt Lab, Beijing 100875, Peoples R China
来源：
SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY | 2007年 / 62卷 / 6-7期
关键词：
Confocal XRF; micro XRF; depth profile; 3-D XRF; wheat grain;
D O I：
10.1016/j.sab.2007.02.014
中图分类号：
O433 [光谱学];
学科分类号：
0703 ; 070302 ;
摘要：
A new confocal micro X-ray fluorescence instrument was developed. This instrument has two independent micro X-ray tubes with Mo targets. A full polycapillary X-ray lens was attached to each X-ray tube. Another half polycapillary lens was attached to a silicon drift X-ray detector (SDD). The focal spots of the three lenses were adjusted to a common position. The effects of the excitation of two X-ray beams were investigated. The instrument enabled highly sensitive three-dimensional X-ray fluorescence analysis. We confirmed that the X-ray fluorescence intensity frorn the sample increased by applying the two independent X-ray tubes in confocal configuration. Elemental depth profiling of black wheat was demonstrated with the result that each element in the surface coat of a wheat grain showed unique distribution. (c) 2007 Elsevier B.V All rights reserved.
引用
收藏
页码：549 / 553
页数：5
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