Spectroellipsometric study of lead lanthanum zirconate titanate amorphous ferroelectric-like thin films

被引:2
|
作者
Li, QJ [1 ]
Zhu, DR
Mo, D
Xu, YH
Mackenzie, JD
机构
[1] Zhongshan Univ, Dept Phys, Guangzhou 510275, Peoples R China
[2] Univ Calif Los Angeles, Dept Mat Sci & Engn, Los Angeles, CA 90024 USA
关键词
D O I
10.1088/0256-307X/15/8/020
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
Lead lanthanum zirconate titanate (PLZT) amorphous thin films whose composition is stoichiometric 9/65/35 have been grown and they show some wonderful ferroelectric-like properties. The ellipsometric spectra of the PLZT ferroelectric-like amorphous films have been obtained by a homemade automatic ellipsometer in the wavelength range of 200-700 nm, and their optical constant (refractive index n and extinction coefficient k) spectra have been determined. As the photon energy changes from 1.9 to 5.8 eV, the refractive index n of the PLZT amorphous films increases from 2.13 to 2.46, then decreases to 1.45. The absorption edge of the PLZT amorphous films is about 300 nm, while that of the transparent ceramics with the same composition is about 377 nm.
引用
收藏
页码:600 / 602
页数:3
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