Effect of TiO2 doped Ni electrodes on the dielectric properties and microstructures of (Ba0.96Ca0.04)(Ti0.85Zr0.15)O3 multilayer ceramic capacitors

被引:19
|
作者
Chiang, Chen-Su [2 ]
Lee, Ying-Cliieh [1 ]
Shiao, Fu-Thang [3 ]
Lee, Wen-Hsi [2 ]
Hennings, Detlev [4 ]
机构
[1] Natl Pingtung Univ Sci & Technol, Dept Mat Engn, Pingtung, Taiwan
[2] Natl Cheng Kung Univ, Dept Elect Engn, Tainan 701, Taiwan
[3] Walsin Technol Corp, Dept Mat Res, Kaohsiung, Taiwan
[4] Forschungszentrum Julich GmbH, Dept Elect Mat, D-52425 Julich, Germany
关键词
TiO2 doped Ni electrode; MLCC; Reducing atmosphere; (Ba0.96Ca0.04)(Ti0.85Zr0.15)O-3; BASE-METAL-ELECTRODE; BARIUM-TITANATE; NICKEL ELECTRODES; END-TERMINATION; SINTERED BATIO3; TEMPERATURE; ATMOSPHERE; BEHAVIOR; ANATASE; FUTURE;
D O I
10.1016/j.jeurceramsoc.2011.11.009
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
The effects of TiO2-doped Ni electrodes cn the microstructures and dielectric properties of (Ba0.96Ca0.04)(Ti0.85Zr0.15)O-3 multilayer ceramic capacitors (MLCCs) have been investigated. Nickel paste with a TiO2 dopant was used as internal electrodes in MLCCs based on (Ba0.96Ca0.04)(Ti0.85Zr0.15)O-3 (BCTZ) ceramic with copper end-termination. The microstructures and defects were analysed by microstructural techniques (SEM/HRTEM) and energy-dispersive spectroscopy (EDS). The continuity of the electrode of the MLCC was measured using a scanning electron microscope, which showed that the continuity of the electrode for the MLCC with a TiO2-doped Ni electrode was approximately 90%. However, continuity of the electrode for a conventional MLCC was below 80%. The continuity of the TiO2-doped Ni electrode showed significant improvement in the MLCC, which was due to no reaction between Ni and BCTZ. Crown Copyright (C) 2011 Published by Elsevier Ltd. All rights reserved.
引用
收藏
页码:865 / 873
页数:9
相关论文
共 50 条
  • [1] High dielectric constant of (Ba0.96Ca0.04)(Ti0.85Zr0.15)O3 multilayer ceramic capacitors with Cu doped Ni electrodes
    Lee, Ying-Chieh
    Chiang, Chen-Su
    JOURNAL OF ALLOYS AND COMPOUNDS, 2011, 509 (24) : 6973 - 6979
  • [2] Influence of SiO2 Addition on the Dielectric Properties and Microstructure of (Ba0.96Ca0.04)(Ti0.85Zr0.15)O3 Ceramics
    Lee, Ying-Chieh
    Lin, Chia-Wei
    Lu, Wei-Hua
    Chen, Wen-Jauh
    Lee, Wen-Hsi
    INTERNATIONAL JOURNAL OF APPLIED CERAMIC TECHNOLOGY, 2009, 6 (06) : 692 - 701
  • [3] Dielectric properties and microstructures of Ba(Ti,Zr)O3 multilayer ceramic capacitors with Ni electrodes
    Feng, QQ
    McConville, CJ
    Edwards, DD
    JOURNAL OF THE AMERICAN CERAMIC SOCIETY, 2005, 88 (06) : 1455 - 1460
  • [4] Investigation on the dielectric properties of Mg-doped (Ba0.95Ca0.05) (Ti0.85Zr0.15)O3 ceramics
    Miao, Jiyuan
    Zhang, Zhiqiang
    Liu, Zhifu
    Li, Yongxiang
    CERAMICS INTERNATIONAL, 2015, 41 : S487 - S491
  • [5] A novel approach to sintering (Ba,Ca)(Ti,Zr)O3 multilayer ceramic capacitors with Ni electrodes
    Wang, Shih-Hao
    Chai, Yin-Lai
    Lee, Wen-Hsi
    JOURNAL OF THE EUROPEAN CERAMIC SOCIETY, 2012, 32 (08) : 1711 - 1723
  • [6] Effect of Li2O-SiO2-xMO glass addition on the dielectric properties and microstructures of (Ba,Ca)(Ti,Zr)O3 for multilayer ceramic capacitors with nickel electrodes
    Choi, CH
    Chang, DG
    Kim, WS
    Hur, KH
    Choi, CJ
    JOURNAL OF THE KOREAN PHYSICAL SOCIETY, 2003, 42 : S1017 - S1020
  • [7] Dielectric properties of Ba(Ti0.85Zr0.15)O3 film prepared by metalorganic chemical vapor deposition
    Tohma, T
    Masumoto, H
    Goto, T
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 2003, 42 (11): : 6969 - 6972
  • [9] Effects of calcination temperature and A/B ratio on the dielectric properties of (Ba,Ca)(Ti,Zr,Mn)O3 for multilayer ceramic capacitors with nickel electrodes
    Lee, WH
    Tseng, TY
    Hennings, DFK
    JOURNAL OF THE AMERICAN CERAMIC SOCIETY, 2000, 83 (06) : 1402 - 1406
  • [10] Dielectric Properties of Ba(Ti0.85Zr0.15)O 3 Film Prepared by Metalorganic Chemical Vapor Deposition
    Tohma, Tetsuro
    Masumoto, Hiroshi
    Goto, Takashi
    Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 2003, 42 (11): : 6969 - 6972