Double layer formation in Mg-TM switchable mirrors (TM: Ni, Co, Fe)

被引:18
|
作者
Lohstroh, W [1 ]
Westerwaal, RJ [1 ]
Lokhorst, AC [1 ]
van Mechelen, JLM [1 ]
Dam, B [1 ]
Griessen, R [1 ]
机构
[1] Vrije Univ Amsterdam, Fac Sci, Dept Phys & Astron, NL-1081 BT Amsterdam, Netherlands
关键词
light absorption and reflection; hydrogen storage materials; thin films;
D O I
10.1016/j.jallcom.2004.11.127
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
The optical properties of Mg-TM (TM: Ni, Co, Fe; Mg:TM approximate to 2) thin films during hydrogenation are investigated using reflection and transmission measurements. Mg-Ni and Mg-Co show an unusual behavior upon exposure to hydrogen. The nucleation of the hydride starts at the film substrate interface and not - as intuitively expected - at the Pd covered top side of the film. Consequently, a double layer structure is formed. Reflection measurements are used to identify the loading behavior as the double layering yields to an remarkable optical black state at intermediate hydrogen concentrations. Photometric measurements on samples loaded at H-2-pressures of 10(5) Pa show that in Mg-NiHx and Mg-CoHx the complex hydrides Mg2NiH4 and Mg2COH5 are formed, whereas in Mg-Fe-x the formation of MgH2 is prevalent. (c) 2005 Elsevier B.V. All rights reserved.
引用
收藏
页码:490 / 493
页数:4
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