Tunable intensity of the spectral reflectance of a guided-mode resonance filter with dual channels

被引:13
|
作者
Wang, Qi [1 ]
Zhang, Dawei [1 ]
Huang, Yuanshen [1 ]
Ni, Zhengji [1 ]
Zhuang, Songlin [1 ]
机构
[1] Univ Shanghai Sci & Technol, Shanghai Key Lab Modern Opt Syst, Sch Opt Elect & Comp Engn, Shanghai 200093, Peoples R China
来源
OPTICS AND LASER TECHNOLOGY | 2011年 / 43卷 / 07期
基金
中国国家自然科学基金;
关键词
Diffraction and gratings; Subwavelength structures; Wavelength filtering devices; OPTICAL FILTERS; GRATING FILTER; LIGHT;
D O I
10.1016/j.optlastec.2011.02.004
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Simulating the characteristics of a guided-mode resonance filter with rigorous coupled wave analysis, we find that, by adjusting the azimuthal angle of the grating used as a sub-layer of the guided-mode resonance filter from 0 degrees to 90 degrees under TE-reflectance, the intensity of the spectral reflectance of the guided-mode resonance filter monotonically increases at the wavelength of 684.6 nm, while the spectral reflectance monotonically decreases at the wavelength of 723 nm. Moreover, the spectral reflectance with TE-reflectance at 90 degrees corresponds to the TM-reflectance at 0 degrees. The phenomenon means that the intensity of the spectral reflectance can be easily tuned with different azimuthal angles by choosing appropriate structure parameters of the guided-mode resonance filter. (C) 2011 Elsevier Ltd. All rights reserved.
引用
收藏
页码:1091 / 1095
页数:5
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