Characterization of nanostructured photosensitive cadmium sulphide thin films grown by SILAR deposition technique

This paper reports the preparation of photosensitive nanostructured CdS thin films by Successive Ionic Layer Adsorption and Reaction (SILAR) method at room temperature. To obtain good quality CdS thin films, preparative conditions such as concentration of cationic and anionic precursors, adsorption and rinsing time durations etc. are optimized. The structural, optical, and electrical characterizations of the as-deposited and annealed CdS thin films were carried out using X-ray diffraction, scanning electron microscopy, optical absorption and electrical resistivity methods. The photoconductivity studies showed that the annealed films are more than that photosensitive. The TEP measurement shows that deposited films are of n-type.