Stability studies of few-layer InSe nanosheets by Raman spectroscopy

被引:6
|
作者
Xie, Qiyun [1 ]
Hu, Chengxiang [1 ]
Xu, Lihuan [1 ]
Chen, Limin [1 ]
Wang, Wei [2 ,3 ]
Yin, Handi [4 ]
Cheng, Guofeng [4 ]
Ai, Xiaoqian [5 ]
机构
[1] Nanjing Univ Posts & Telecommun, Coll Elect & Opt Engn, Nanjing 210023, Jiangsu, Peoples R China
[2] Nanjing Tech Univ, Key Lab Flexible Elect, Nanjing 211816, Peoples R China
[3] Nanjing Tech Univ, Inst Adv Mat, Jiangsu Natl Synerget Innovat Ctr Adv Mat, Nanjing 211816, Peoples R China
[4] Shanghai Inst Ceram Chinese Acad Sci, Anal & Testing Ctr Inorgan Mat, Shanghai 200050, Peoples R China
[5] Jiangsu Second Normal Univ, Coll Phys & Elect Engn, Nanjing 210013, Peoples R China
基金
中国国家自然科学基金;
关键词
Semiconductor; Stability; Raman spectra; OPTICAL-PROPERTIES; SCATTERING; DEFECTS;
D O I
10.1016/j.ssc.2021.114417
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
The knowledge of the chemical stability of few-layer InSe nanosheets is important for its potential practical device applications. Here, the degradation characteristics of the as-exfoliated ultrathin InSe are studied through Raman spectroscopy. Under the laser excitation of 1 mW, very fast laser-induced degradation has been demonstrated. Moreover, it is found that fewer layered InSe is unstable even after exposure to air for a few hours. The oxidation products during the degradation process are also carefully examined, which are shown to be In2Se3 and In2O3.
引用
收藏
页数:5
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