Time-of-flight secondary-ion-mass spectrometric (ToF-SIMS) and X-ray photoelectron spectroscopic (XPS) analyses of the surface lipids of wool

被引：15

作者：

Shao, J ^{[1
]}

Jones, DC

Mitchell, R

Vickerman, JC

Carr, CM

机构：

[1] Univ Manchester, Inst Sci & Technol, Dept Text, Manchester 1, Lancs, England

[2] Univ Manchester, Inst Sci & Technol, Dept Chem, Manchester 1, Lancs, England

[3] CSMA Ltd, Manchester 1, Lancs, England

来源：

JOURNAL OF THE TEXTILE INSTITUTE | 1997年 / 88卷 / 04期

关键词：

D O I：

10.1080/00405000.1997.11090886

中图分类号：

TB3 [工程材料学]; TS1 [纺织工业、染整工业];

学科分类号：

0805 ; 080502 ; 0821 ;

摘要：

ToF-SIMS studies of wool show the presence of lipid material at the surface epicuticle layer. The major lipid component is a C-21-fatty acid linked to the wool protein via a thioester linkage. This C-21-fatty-acid species is sensitive to chemical attack and is removed/modified by aqueous chlorination and plasma treatment but is relatively unaffected by permonosulphuric acid (PMS)/sulphite treatment, XPS confirms that less sulphur oxidation occurs with PMS/sulphite treatment than with aqueous chlorination.

引用

页码：317 / 324

页数：8

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