A three-dimensional numerical simulation modeling is developed to investigate the background pressure's effect on the characteristics of ion impingement on the accelerator grid for the ion optical system. The immersed-finite-element particle-in-cell (IFE-PIC) method is combined with Monte Carlo method to compute the electric field, track the ions, and describe the charge-exchange collision process while direct simulation Monte Carlo (DSMC) method is adopted to simulate the motion of neutral atoms. Results show that the residual neutral atoms in the vacuum chamber play an important role in the neutral atoms distribution when the background pressure is higher than a specific magnitude, and the accelerator grid impingement current increases with the increase of the background pressure. To improve the reliability of ion thruster service lifetime prediction in the ground life tests, the background pressure in the vacuum chamber should be below 10(-3) Pa. (C) 2015 Elsevier Ltd. All rights reserved.
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Shenzhen Graduate School, Harbin Institute of Technology, Shenzhen 518055, ChinaShenzhen Graduate School, Harbin Institute of Technology, Shenzhen 518055, China
Wang, Ermeng
Chu, Yuchuan
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Shenzhen Graduate School, Harbin Institute of Technology, Shenzhen 518055, ChinaShenzhen Graduate School, Harbin Institute of Technology, Shenzhen 518055, China
Chu, Yuchuan
Cao, Yong
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Shenzhen Graduate School, Harbin Institute of Technology, Shenzhen 518055, ChinaShenzhen Graduate School, Harbin Institute of Technology, Shenzhen 518055, China
Cao, Yong
Li, Juan
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Lanzhou Institute of Physics, Lanzhou 730000, ChinaShenzhen Graduate School, Harbin Institute of Technology, Shenzhen 518055, China
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City Univ Hong Kong, Dept Phys & Mat Sci, Kowloon, Hong Kong, Peoples R ChinaCity Univ Hong Kong, Dept Phys & Mat Sci, Kowloon, Hong Kong, Peoples R China
Kwok, Dixon T. K.
Li, Jianhui
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City Univ Hong Kong, Dept Phys & Mat Sci, Kowloon, Hong Kong, Peoples R ChinaCity Univ Hong Kong, Dept Phys & Mat Sci, Kowloon, Hong Kong, Peoples R China
Li, Jianhui
Ma, Xiaobo
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City Univ Hong Kong, Dept Phys & Mat Sci, Kowloon, Hong Kong, Peoples R ChinaCity Univ Hong Kong, Dept Phys & Mat Sci, Kowloon, Hong Kong, Peoples R China
Ma, Xiaobo
Chu, Paul K.
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City Univ Hong Kong, Dept Phys & Mat Sci, Kowloon, Hong Kong, Peoples R ChinaCity Univ Hong Kong, Dept Phys & Mat Sci, Kowloon, Hong Kong, Peoples R China
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East China Univ Technol, Sch Mech & Elect Engn, Nanchang 330013, Jiangxi, Peoples R ChinaEast China Univ Technol, Sch Mech & Elect Engn, Nanchang 330013, Jiangxi, Peoples R China
Jiang, Qing-song
Liu, He-sheng
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East China Univ Technol, Sch Mech & Elect Engn, Nanchang 330013, Jiangxi, Peoples R ChinaEast China Univ Technol, Sch Mech & Elect Engn, Nanchang 330013, Jiangxi, Peoples R China
Liu, He-sheng
Wang, Xiao-chun
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Qingdao Haier Technol Co Ltd, Qingdao, Peoples R ChinaEast China Univ Technol, Sch Mech & Elect Engn, Nanchang 330013, Jiangxi, Peoples R China
Wang, Xiao-chun
Hu, Zhi-xin
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East China Univ Technol, Sch Mech & Elect Engn, Nanchang 330013, Jiangxi, Peoples R ChinaEast China Univ Technol, Sch Mech & Elect Engn, Nanchang 330013, Jiangxi, Peoples R China
Hu, Zhi-xin
Zhou, Hai-ying
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East China Univ Technol, Sch Mech & Elect Engn, Nanchang 330013, Jiangxi, Peoples R ChinaEast China Univ Technol, Sch Mech & Elect Engn, Nanchang 330013, Jiangxi, Peoples R China
Zhou, Hai-ying
Nie, Hua-rong
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Qingdao Univ Sci & Technol, Sch Polymer Sci & Engn, Qingdao, Peoples R ChinaEast China Univ Technol, Sch Mech & Elect Engn, Nanchang 330013, Jiangxi, Peoples R China