Interpretation of frictional-force microscopy images based on the two-dimensional stick-slip motion of the tip atom

被引：16
|
作者：
Sasaki, N
Kobayashi, K
Tsukada, M
机构：
来源：
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 1996年 / 35卷 / 6B期
关键词：
FFM; AFM; atomic-scale friction; 2D stick-slip; tip atom; cantilever; graphite; harmonic potential; Lennard-Jones potential;
D O I：
10.1143/JJAP.35.3700
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
Frictional-force microscopy (FFM) images of graphite are calculated by a numerical simulation using a static model. We find that a remarkable transition of the FFM image pattern occurs depending on the cantilever stiffness. This image transition is interpreted based on the two-dimensional stick-slip motion of the tip atom. It is clarified that the frictional force image pattern reflects two kinds of tip atom motion: 1) straight motion and 2) zigzag motion.
引用
收藏
页码：3700 / 3705
页数：6
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