Conformational morphology of polyaniline grown on self-assembled monolayer modified silicon

被引：4

作者：

Sutar, D. S. ^{[1
,2
]}

Major, S. S. ^{[1
]}

Srinivasa, R. S. ^{[3
]}

Yakhmi, J. V. ^{[4
]}

机构：

[1] Indian Inst Technol, Dept Phys, Bombay 400076, Maharashtra, India

[2] Indian Inst Technol, Cent Surface Analyt Facil, Bombay 400076, Maharashtra, India

[3] Indian Inst Technol, Dept Met Engn & Mat Sci, Bombay 400076, Maharashtra, India

[4] Bhabha Atom Res Ctr, Tech Phys Div, Bombay 400085, Maharashtra, India

来源：

THIN SOLID FILMS | 2011年 / 520卷 / 01期

关键词：

Self-assembly; Polyaniline; Atomic force microscopy; Power spectral density; High-resolution transmission electron microscopy; ATOMIC-FORCE MICROSCOPY; THIN-FILM; MOLECULAR-WEIGHT; X-RAY; RESOLUTION; POLYMERIZATION; TRANSPORT; ISLANDS;

D O I：

10.1016/j.tsf.2011.07.006

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Polyaniline (PANI) films with pyramidal shaped crystallites were prepared by self-organization on self-assembled monolayer (SAM) modified Si substrates. High-resolution atomic force microscopy (HR-AFM) shows that SAM has tridymite structural order and the PANI film has biphasic conformational morphology corresponding to face-on orientation and edge-on orientation. Order parameters obtained from power spectral density analysis of HR-AFM images of SAM and PANI films show that the pyramidal crystallites are in emeraldine salt (ES-I) form and the region between the crystallites is in emeraldine base (EB-II) form. The ordered lattice of PANI crystallites as observed by cross-sectional HR-TEM confirms its single crystalline nature as well as epitaxial growth. The heteroepitaxial growth of PANI is attributed to the structural order of interfacial SAM on Si. (C) 2011 Elsevier B.V. All rights reserved.

引用

页码：351 / 355

页数：5

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