Small disturbance voltage stability analysis considering the effect of dynamic load parameters

被引：0
|
作者：
Zhang, J. F. [1 ]
Tse, C. T. [1 ]
Wang, K. W. [2 ]
Chung, C. Y. [1 ]
机构：
[1] Hong Kong Polytech Univ, Dept Elect Engn, Kowloon, Hong Kong, Peoples R China
[2] Zhengzhou Univ China, Dept Elect Engn, Zhengzhou, Peoples R China
来源：
2007 CONFERENCE PROCEEDINGS IPEC, VOLS 1-3 | 2007年
关键词：
dynamic load model; probabilistic eigenvalue;
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Small disturbance voltage stability is analyzed on the P-V curve with the exponential recovery dynamic loads. The effect of dynamic load parameters on the analysis result is investigated using probabilistic egienvalues under the assumption that the load parameters are normally distributed. The analysis is tested on a three-machine and nine-bus system. The result shows that the probabilistic analysis is helpful to obtain the correct analysis result if there are uncertainties in load parameters.
引用
收藏
页码：371 / +
页数：2
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