Atomic resolution electron tomography

被引:21
|
作者
Bals, Sara [1 ]
Goris, Bart [1 ]
De Backer, Annick [1 ]
Van Aert, Sandra [1 ]
Van Tendeloo, Gustaaf [1 ]
机构
[1] Univ Antwerp, Electron Microscopy Materials Res Lab, Antwerp, Belgium
基金
欧洲研究理事会;
关键词
Z-CONTRAST; SCALE; STRAIN; NANOPARTICLE; CLUSTERS; SHAPE;
D O I
10.1557/mrs.2016.138
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Over the last two decades, three-dimensional (3D) imaging by transmission electron microscopy or "electron tomography" has evolved into a powerful tool to investigate a variety of nanomaterials in different fields, such as life sciences, chemistry, solid-state physics, and materials science. Most of these results were obtained with nanometer-scale resolution, but different approaches have recently pushed the resolution to the atomic level. Such information is a prerequisite to understand the specific relationship between the atomic structure and the physicochemical properties of (nano) materials. We provide an overview of the latest progress in the field of atomic-resolution electron tomography. Different imaging and reconstruction approaches are presented, and state-of-the-art results are discussed. This article demonstrates the power and importance of electron tomography with atomic-scale resolution.
引用
收藏
页码:525 / 530
页数:6
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