Millimeter wave inspection of concealed objects

被引：18
|
作者：
Jaeger, Irina [1 ]
Zhang, Lixiao [1 ]
Stiens, Johan [1 ]
Sahli, Hichem [1 ]
Vounckx, Roger [1 ]
机构：
[1] Vrije Univ Brussel, Dept Elect, B-1050 Brussels, Belgium
来源：
MICROWAVE AND OPTICAL TECHNOLOGY LETTERS | 2007年 / 49卷 / 11期
基金：
美国国家科学基金会;
关键词：
millimeter-wave imaging; microwave sensors; nondestructive sensing; image processing;
D O I：
10.1002/mop.22870
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Imaging concealed objects with a millimeter-wave coherent beam is accompanied with speckle. Two tools were chosen to improve visibility of concealed objects for security or industrial inspection: a speckle contrast image (image processing tool) and a Hadamard diffuser (mechanical tool). We report more then 50% speckle reduction over the full W-band. (C) 2007 Wiley Periodicals, Inc.
引用
收藏
页码：2733 / 2737
页数：5
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