A Low-Overhead Radiation Hardened Flip-Flop Design for Soft Error Detection

被引：0
|
作者：
Li, Jie [1 ]
Xiao, Li-Yi [1 ]
Li, Hong-Chen [1 ]
Qi, Chun-Hua [2 ]
机构：
[1] Harbin Inst Technol, Microelect Ctr, Harbin 150001, Heilongjiang, Peoples R China
[2] Harbin Inst Technol, Res Ctr Basic Space Sci, Harbin 150001, Heilongjiang, Peoples R China
来源：
2018 14TH IEEE INTERNATIONAL CONFERENCE ON SOLID-STATE AND INTEGRATED CIRCUIT TECHNOLOGY (ICSICT) | 2018年
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
In this paper, a low overhead radiation hardened flip-flop is developed for detecting soft errors caused by SET and SEU or timing issues. Error detection is based on comparing the values stored in a redundant latch and the original latch. The error signal is triggered if the different values are detected. The redundant latch is controlled by a generated pulsed clock for overcoming the hold-time violation issue. Simulation results show that the proposed flip-flop can efficiently detect the soft errors induced by SET or SEU, and has the lowest area overhead compared with the exiting circuits.
引用
收藏
页码：1175 / 1177
页数：3
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