Dielectric study of ZnO nanorods synthesized by thermal decomposition method

ZnO nanorods were prepared by well-known thermal decomposition method. Nanorods were synthesized with two different annealing temperature 300 degrees Cand 500 degrees C. Prepared samples were characterized with different characterization methods. X-ray diffraction (XRD) results confirmed the formation of hexagonal structure of ZnO. Field emission scanning electron microscope (FESEM) images show formation of ZnO nanorods with different size and shape. Dielectric study also investigated for prepared samples. Dielectric study indicated that sample '500' gives high dielectric constant in low frequency region. Nyquist plots showed reducing of grain boundaries with increasing annealing temperature. (c) 2021 Elsevier Ltd. All rights reserved. Selection and peer-review under responsibility of the scientific committee of the International Conference on Advances in Materials Science, Communication and Microelectronics.