Structural and Electrical Characterization of Ag(Ta0.5Nb0.5)O3 and Ag(Ta0.8Nb0.2)O3 Ceramics

Low-loss ferroelectric materials have been extensively investigated for high-frequency applications. Especially, weak frequency dispersion materials with high dielectric permittivity and low loss tangent have enormous potential for electronic components, including filters and embedded capacitors. We found the Ag(Ta0.8Nb0.2)O-3 material to have weak frequency dispersion. In this paper, we will discuss the dielectric and the relaxation properties of Ag(Ta0.5Nb0.5)O-3 and Ag(Ta0.8Nb0.2)O-3 ceramics for device applications. X-ray diffraction analyses were performed to determine their structural properties, and both the frequency-dependent dielectric permittivity and the time-dependent relaxation behavior were analyzed to determine their electrical properties.