High-current Z-pinch disintegration and the problem of peripheral equipment protection

被引：3

作者：

Zaitsev, V. I. ^{[1
]}

Andryanov, Yu V. ^{[1
]}

Volkov, G. S. ^{[1
]}

Grabovsky, Ye V. ^{[1
]}

Lakhtyushko, N. I. ^{[1
]}

Kartashov, A. V. ^{[1
]}

机构：

[1] State Res Ctr Russian Fed, Troitsk Inst Innovat & Fus Res, Moscow 142190, Russia

来源：

PLASMA DEVICES AND OPERATIONS | 2008年 / 16卷 / 01期

基金：

俄罗斯基础研究基金会;

关键词：

decay product; equipment protection; Z-pinch; electromagnetic valve gate; plasma flow; microparticles;

D O I：

10.1080/10519990701872306

中图分类号：

TL [原子能技术]; O571 [原子核物理学];

学科分类号：

0827 ; 082701 ;

摘要：

The process of Z-pinch decay upon current termination is considered. The experimental data obtained for the Angara-5-1 facility on compression of multiwire tungsten liners are discussed. It is shown that among the decay products there are microparticles of the eroded liner construction material and plasma fluxes. It was determined that the plasma flow velocities exceeded the 'thermal' velocities of the Z-pinch plasma. A model for the description of the process of ion acceleration based on an ambipolar mechanism is suggested. Precautions for protection of the peripheral equipment against the decay products of Z-pinch are discussed and protective components are studied. A fast electromagnetic shutter is used for protection from microparticles.

引用

页码：61 / 66

页数：6

共 50 条

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